JPH0712942Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JPH0712942Y2 JPH0712942Y2 JP1087190U JP1087190U JPH0712942Y2 JP H0712942 Y2 JPH0712942 Y2 JP H0712942Y2 JP 1087190 U JP1087190 U JP 1087190U JP 1087190 U JP1087190 U JP 1087190U JP H0712942 Y2 JPH0712942 Y2 JP H0712942Y2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply current
- comparator
- power
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 33
- 238000005259 measurement Methods 0.000 claims description 13
- 238000010586 diagram Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1087190U JPH0712942Y2 (ja) | 1990-02-05 | 1990-02-05 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1087190U JPH0712942Y2 (ja) | 1990-02-05 | 1990-02-05 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03101482U JPH03101482U (en]) | 1991-10-23 |
JPH0712942Y2 true JPH0712942Y2 (ja) | 1995-03-29 |
Family
ID=31514420
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1087190U Expired - Lifetime JPH0712942Y2 (ja) | 1990-02-05 | 1990-02-05 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0712942Y2 (en]) |
-
1990
- 1990-02-05 JP JP1087190U patent/JPH0712942Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH03101482U (en]) | 1991-10-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH11174113A (ja) | Icテスタの電圧印加電流測定回路 | |
KR20010020388A (ko) | 누설 전류 보상회로를 구비하는 집적회로 테스터 | |
JP3119335B2 (ja) | Ic試験装置 | |
JPH0712942Y2 (ja) | Ic試験装置 | |
US6949946B1 (en) | Integrated semiconductor circuit and method for functional testing of pad cells | |
JPH0645909Y2 (ja) | Ic試験装置 | |
JPH11326441A (ja) | 半導体試験装置 | |
JPH0743430A (ja) | Icテスタ用校正装置 | |
JPS60253883A (ja) | 定電流負荷兼定電圧印加電流測定器 | |
JPH0559354U (ja) | Ic試験装置 | |
JP2000206175A (ja) | Lsi電流測定装置 | |
JPH06148264A (ja) | リーク電流の測定方法 | |
JPH0212074A (ja) | Ic試験装置における測定用電源装置 | |
JPS61221681A (ja) | Ic検査システム | |
KR0168066B1 (ko) | 인쇄배선판용 동작검사시스템의 방전장치 | |
JPH0212066A (ja) | 測定用電源装置 | |
JP2001166005A (ja) | 半導体試験装置のデバイス用電源装置 | |
KR940006603B1 (ko) | 포탄 근접신관의 카스텀 회로(Custom IC) 측정장치 | |
KR20000006076A (ko) | 반도체시험장치용바이어스전원회로 | |
JPH0524222Y2 (en]) | ||
JP2996989B2 (ja) | Icテスターのピン電流測定回路及びその基板 | |
JP2743864B2 (ja) | 半導体集積回路及びそのテスト方法 | |
JP4122596B2 (ja) | リードリレー駆動回路 | |
JPH05256890A (ja) | 接続検査装置 | |
JP2561076Y2 (ja) | 抵抗測定装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |